Elliptic fit of objects in two and three dimensions by moment of inertia optimization

Orthogonal Distance Fitting of Implicit Curves and Surfaces

IEEE Transactions on Pattern Analysis and Machine Intelligence

Map Learning and Clustering in Autonomous Systems

IEEE Transactions on Pattern Analysis and Machine Intelligence

A simple least squares method for fitting of ellipses and circles depends on border points of a two-tone image and their 3-D extensions

Pattern Recognition Letters

Construction of a computer-simulated mixed reality environment for virtual factory layout planning

Computers in Industry

Handling complex events in surveillance tasks

ICIAP'11 Proceedings of the 16th international conference on Image analysis and processing - Volume Part II