An efficient face verification method in a transformed domain

Authors:
Marcos Faundez-Zanuy;Josep Roure;Virginia Espinosa-Duró;Juan Antonio Ortega
Affiliations:
Departamento de Ingeniería Electrónica, UPC Terrassa, Spain;Departamento de Ingeniería Electrónica, UPC Terrassa, Spain;Departamento de Ingeniería Electrónica, UPC Terrassa, Spain;Departamento de Ingeniería Electrónica, UPC Terrassa, Spain
Venue:
Pattern Recognition Letters
Year:
2007

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Abstract

In this paper we propose a low-complexity face verification system based on the Walsh-Hadamard transform. This system can be easily implemented on a fixed point processor and offers a good compromise between computational burden and verification rates. We have evaluated that with 36 integer coefficients per face we achieve better Detection Cost Function (6.05%) than the classical eigenfaces approach (minimum value 6.99% with 126 coefficients), with a smaller number of coefficients.