Reconfigurable approximate pattern matching architectures for nanotechnology

  • Authors:
  • Viswanath Annampedu;Meghanad D. Wagh

  • Affiliations:
  • Storage Products, Agere Systems Inc., Allentown, PA 18109, USA;Department of Electrical and Computer Engineering, Lehigh University, Bethlehem, PA 18015, USA

  • Venue:
  • Microelectronics Journal
  • Year:
  • 2007

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Abstract

Approximate pattern matching is comparing an input pattern with a target pattern with a specified error tolerance. This ability to compensate for real-world sensor errors makes approximate pattern matching an ideal choice for a wide range of applications. This paper shows that two n-bit patterns may be matched with a single stage nanotechnology architecture using 2n+1 unit area resonant tunneling diodes (RTDs) and one RTD of 1.5 times the unit area. This architecture is reconfigurable for any target pattern and any error tolerance. We analyze current and power characteristics of the architecture and develop configurations to minimize the same. The robustness of the architecture to variations in device characteristics is also investigated.