Modeling of evoked potentials of electroencephalograms: An overview

Authors:
S. Murali;V. Vladimir Kulish
Affiliations:
Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, Singapore 638075;School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798
Venue:
Digital Signal Processing
Year:
2007

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Abstract

Electroencephalograms (EEGs) are brain waves, which are recorded using scalp electrodes. Generally, signal attenuate on recording and amplitude of the evoked potentials (EPs) are low when merged with the base brain waves. Therefore, mathematical tools are needed to analysis the time series (EEGs) to discover the EPs in the base EEGs. This paper reviews spectral analysis based on periodic amplitude analysis (PAA), wavelet transform (WT), fast Fourier transform (FFT), and fractal dimension (FD) of EEGs to predict the evoked potentials.