State probability of a series-parallel repairable system with two-types of failure states

Authors:
G. Levitin;T. Zhang;M. Xie
Affiliations:
Reliability Department, Planning, Development and Technology Division, Israel Electric Corporation Ltd., Haifa, Israel;Department of Industrial and Systems Engineering, National University of Singapore, Singapore;Department of Industrial and Systems Engineering, National University of Singapore, Singapore
Venue:
International Journal of Systems Science
Year:
2006

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Abstract

This paper presents a method for the analysis of a series-parallel safety-critical system where the system states can be distinguished into failure-safe and failure-dangerous. The method incorporates the Markov chain and universal generating function technique. In the model considered, both periodic inspection and repair (perfect and imperfect) of system elements are taken into account. The system state distributions and the overall system safety function are derived, based on the developed model. The proposed method is applicable to complex systems for analysing state distributions and it is also useful in decision-making such as determining the optimal proof-test interval or repair resource allocation. An illustrative example is given.