Diagnosis of Embedded Software Using Program Spectra

Authors:
Peter Zoeteweij;Rui Abreu;Rob Golsteijn;Arjan J. C. van Gemund
Affiliations:
Delft University of Technology, The Netherlands;Delft University of Technology, The Netherlands;NXP Semiconductors, The Netherlands;Delft University of Technology, The Netherlands
Venue:
ECBS '07 Proceedings of the 14th Annual IEEE International Conference and Workshops on the Engineering of Computer-Based Systems
Year:
2007

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Abstract

Automated diagnosis of errors detected during software testing can improve the efficiency of the debugging process, and can thus help to make software more reliable. In this paper we discuss the application of a specific automated debugging technique, namely software fault localization through the analysis of program spectra, in the area of embedded software in high-volume consumer electronics products. We discuss why the technique is particularly well suited for this application domain, and through experiments on an industrial test case we demonstrate that it can lead to highly accurate diagnoses of realistic errors.