Advanced analysis techniques for cross-product coverage

Authors:
H. Azatchi;L. Fournier;A. Ziv;K. Zohar
Affiliations:
IBM Res. Lab. in Haifa, Israel;IBM Res. Lab. in Haifa, Israel;IBM Res. Lab. in Haifa, Israel;IBM Res. Lab. in Haifa, Israel
Venue:
HLDVT '05 Proceedings of the High-Level Design Validation and Test Workshop, 2005. on Tenth IEEE International
Year:
2005

Citing 0
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Functional test selection based on unsupervised support vector analysis

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Increasing the efficiency of simulation-based functional verification through unsupervised support vector analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

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Abstract

Deterministic functional test pattern generation has been a long-standing open problem, which is an important problem to be solved for both design verification and manufacturing testing. One key to develop a practical functional test pattern generation ...