Automated test plan generator for database application systems

  • Authors:
  • Mary Ann Robbert;Fred J. Maryanski

  • Affiliations:
  • Dept. of Computer Information Systems, Morisin Hall, Bentley College, Waltham, Massachusetts;Dept. of Computer Science & Engineering, Box U-155, University of Connecticut, Storrs, Connecticut

  • Venue:
  • SIGSMALL '91 Proceedings of the 1991 ACM SIGSMALL/PC symposium on Small systems
  • Year:
  • 1991

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Abstract