Integration of prior knowledge of measurement noise in kernel density classification

  • Authors:
  • Yunlei Li;Dick de Ridder;Robert P. W. Duin;Marcel J. T. Reinders

  • Affiliations:
  • Information and Communication Theory Group, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands;Information and Communication Theory Group, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands;Information and Communication Theory Group, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands;Information and Communication Theory Group, Faculty of Electrical Engineering, Mathematics and Computer Science, Delft University of Technology, Mekelweg 4, 2628 CD Delft, The Netherlands

  • Venue:
  • Pattern Recognition
  • Year:
  • 2008

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Abstract

Samples can be measured with different precisions and reliabilities in different experiments, or even within the same experiment. These varying levels of measurement noise may deteriorate the performance of a pattern recognition system, if not treated with care. Here we seek to investigate the benefit of incorporating prior knowledge about measurement noise into system construction. We propose a kernel density classifier which integrates such prior knowledge. Instead of using an identical kernel for each sample, we transform the prior knowledge into a distinct kernel for each sample. The integration procedure is straightforward and easy to interpret. In addition, we show how to estimate the diverse measurement noise levels in a real world dataset. Compared to the basic methods, the new kernel density classifier can give a significantly better classification performance. As expected, this improvement is more obvious for small sample size datasets and large number of features.