Subpixel determination of imperfect circles characteristics

Authors:
Fabrice Mairesse;Tadeusz Sliwa;Stéphane Binczak;Yvon Voisin
Affiliations:
Université de Bourgogne, Le2i - CNRS UMR 5158, Route des plaines de l'Yonne, BP 16, 89010 Auxerre, France;Université de Bourgogne, Le2i - CNRS UMR 5158, Route des plaines de l'Yonne, BP 16, 89010 Auxerre, France;Université de Bourgogne, Le2i - CNRS UMR 5158, Aile de l'ingénieur, BP 47870, Dijon, France;Université de Bourgogne, Le2i - CNRS UMR 5158, Route des plaines de l'Yonne, BP 16, 89010 Auxerre, France
Venue:
Pattern Recognition
Year:
2008

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Abstract

This article deals with the problem of the determination of characteristics of imperfect circular objects in discrete images, namely the radius and center coordinates. To limit distortion, a multi-level method based on active contours was developed. Its originality is to furnish a set of geometric envelopes in one pass, with a correspondence between grayscale and a regularity scale. The adequacy of this approach was tested with several methods, among them is the Radon-based method. More particularly, this study indicates the relevance of the use of active contours combined with a Radon transform-based method which was improved using a fitting considering the discrete implementation of the Radon transform.