Teager-Kaiser energy and higher-order operators in white-light interference microscopy for surface shape measurement

Authors:
Fabien Salzenstein;Paul C. Montgomery;Denis Montaner;Abdel-Ouahab Boudraa
Affiliations:
Université Louis Pasteur Laboratoire Phase, CNRS/STIC-UPR, Strasbourg Cedex, France;Université Louis Pasteur Laboratoire Phase, CNRS/STIC-UPR, Strasbourg Cedex, France;Université Louis Pasteur Laboratoire Phase, CNRS/STIC-UPR, Strasbourg Cedex, France;IRENav, École Navale, Lanvéoc Poulmic, Brest-Armées, France
Venue:
EURASIP Journal on Applied Signal Processing
Year:
2005

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Abstract

In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are compared in terms of precision, robustness to noise, and subsampling. Flexible energy operators, depending on order and lag parameters, can be obtained. Results show that smoothing and interpolation of envelope approximation using spline model performs better than Gaussian-based approach.