Application of the HLSVD technique to the filtering of X-ray diffraction data

  • Authors:

  • M. Ladisa;A. Lamura;T. Laudadio;G. Nico

  • Affiliations:

  • Istituto di Cristallografia (IC), Consiglio Nazionale delle Ricerche (CNR), Bari, Italy;Istituto Applicazioni del Calcolo Mauro Picone (IAC), Consiglio Nazionale delle Ricerche (CNR), Bari, Italy;SISTA, SCD Division, Department of Electrical Engineering (ESAT), Katholieke Universiteit Leuven, Leuven-Heverlee, Belgium;Istituto Applicazioni del Calcolo Mauro Picone (IAC), Consiglio Nazionale delle Ricerche (CNR), Bari, Italy

  • Venue:
  • EURASIP Journal on Applied Signal Processing
  • Year:
  • 2007

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Abstract

A filter based on the Hankel-Lanczos singular value decomposition (HLSVD) technique is presented and applied for the first time to X-ray diffraction (XRD) data. Synthetic and real powder XRD intensity profiles of nanocrystals are used to study the filter performances with different noise levels. Results show the robustness of the HLSVD filter and its capability to extract easily and effciently the useful crystallographic information. These characteristics make the filter an interesting and user-friendly tool for processing of XRD data.