A methodology for controlling the size of a test suite
ACM Transactions on Software Engineering and Methodology (TOSEM)
Using model checking to generate tests from requirements specifications
ESEC/FSE-7 Proceedings of the 7th European software engineering conference held jointly with the 7th ACM SIGSOFT international symposium on Foundations of software engineering
Test-Suite Reduction and Prioritization for Modified Condition/Decision Coverage
IEEE Transactions on Software Engineering
A Specification-Based Coverage Metric to Evaluate Test Sets
HASE '99 The 4th IEEE International Symposium on High-Assurance Systems Engineering
Design and Synthesis of Synchronization Skeletons Using Branching-Time Temporal Logic
Logic of Programs, Workshop
Mutation Operators for Specifications
ASE '00 Proceedings of the 15th IEEE international conference on Automated software engineering
An Empirical Study of the Effects of Minimization on the Fault Detection Capabilities of Test Suites
ICSM '98 Proceedings of the International Conference on Software Maintenance
Using Model Checking to Generate Tests from Specifications
ICFEM '98 Proceedings of the Second IEEE International Conference on Formal Engineering Methods
Monitoring Programs Using Rewriting
Proceedings of the 16th IEEE international conference on Automated software engineering
Using a Model Checker to Test Safety Properties
ICECCS '01 Proceedings of the Seventh International Conference on Engineering of Complex Computer Systems
Monitoring Java Programs with Java PathExplorer
Monitoring Java Programs with Java PathExplorer
Efficient monitoring of safety properties
International Journal on Software Tools for Technology Transfer (STTT) - Special section on tools and algorithms for the construction and analysis of systems
Test-Suite Reduction for Model Based Tests: Effects on Test Quality and Implications for Testing
Proceedings of the 19th IEEE international conference on Automated software engineering
Generating Efficient Test Sets with a Model Checker
SEFM '04 Proceedings of the Software Engineering and Formal Methods, Second International Conference
Rewriting-Based Techniques for Runtime Verification
Automated Software Engineering
MuJava: an automated class mutation system: Research Articles
Software Testing, Verification & Reliability
Property relevant software testing with model-checkers
ACM SIGSOFT Software Engineering Notes
Redundancy based test-suite reduction
FASE'07 Proceedings of the 10th international conference on Fundamental approaches to software engineering
Specification test coverage adequacy criteria = specification test generation inadequacy criteria
HASE'04 Proceedings of the Eighth IEEE international conference on High assurance systems engineering
Engineering of Software-Intensive Systems: State of the Art and Research Challenges
Software-Intensive Systems and New Computing Paradigms
Issues in using model checkers for test case generation
Journal of Systems and Software
A Formal Logic Approach to Constrained Combinatorial Testing
Journal of Automated Reasoning
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Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checkers. Ease of use and complete automation are major advantages of such approaches. However, the use of a model-checker comes at the price of potential performance problems. If the model used for test-case generation is complex, then model-checker based approaches can be very slow, or even not applicable at all. In this paper, we identify that unnecessary, redundant calls to the model-checker are one of the causes of bad performance. To overcome this problem, we suggest the use of temporal logic rewriting techniques, which originate from runtime verification research. This achieves a significant increase in the performance, and improves the applicability of model-checker based test-case generation approaches in general. At the same time, the suggested techniques achieve a reduction of the resulting test-suite sizes without degradation of the fault sensitivity. This helps to reduce the costs of the test-case execution.