Uniform random walks in very large models

  • Authors:
  • Johan Oudinet

  • Affiliations:
  • LRI, Université Paris-Sud, Orsay Cedex, France

  • Venue:
  • Proceedings of the 2nd international workshop on Random testing: co-located with the 22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007)
  • Year:
  • 2007

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Abstract

This paper presents first experimental results on uniform random generation of paths in very large graphs that model concurrent systems, as it was presented in [3]. The approach is based on techniques and tools for counting and drawing uniformly at random in combinatorial structures. It exploits the fact that in a system made of several concurrent components, local uniform drawings of component paths can be combined into a very good approximation of uniform drawing of paths in the global system, without constructing the global model. The paper describes some implementation of the methods presented in [3], reports results on a first suite of benchmarks, exploring the limits and the possibility of this new approach to uniform random walks.