Soft Error Hardening for Asynchronous Circuits

• Authors:

• Weidong Kuang;Casto Manuel Ibarra;Peiyi Zhao

• Affiliations:

• University of Texas Pan American, Edinburg;University of Texas Pan American, Edinburg;Chapman University, Orange, CA

• Venue:
• DFT '07 Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
• Year:
• 2007