On prediction of system performance from information on component performance
IRE-AIEE-ACM '57 (Western) Papers presented at the February 26-28, 1957, western joint computer conference: Techniques for reliability
Two-dimensional iterative logic
AFIPS '65 (Fall, part I) Proceedings of the November 30--December 1, 1965, fall joint computer conference, part I
The multipurpose bias device, part II: the efficiency of logical elements
IBM Journal of Research and Development
The multipurpose bias device: part I the commutator transistor
IBM Journal of Research and Development
The use of triple-modular redundancy to improve computer reliability
IBM Journal of Research and Development
| Hi-index | 14.98 |
The literature on computer reliability is replete with very convincing arguments for the need and the use of self-repair techniques, as a viable approach to significantly enhancing the reliability of both maintainable and nonmaintainable computers. However, it would seem that no comprehensive and coherent program for the development and optimal employment of such techniques exists. This means that no method exists in the open literature for deciding the following: 1) what self-repair techniques, taken singularly or in combination, provide the greatest improvement in reliability; 2) what methods are optimum for initiating fault diagnosis and self-repair by redundancy and replacement; 3) what constitutes a closed set of self-repair techniques and what theory can be formulated to demonstrate the set's completeness; and 4) what is the effect of self-repair on the total system relative to design, maintenance, availability, and so forth.