Application of the Karhunen-Loève Expansion to Feature Selection and Ordering

  • Authors:
  • K. Fukunaga;W. L. G. Koontz

  • Affiliations:
  • -;-

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1970

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Abstract

The Karhunen-Lo6ve expansion has been used previously to extract important features for representing samples taken from a given distribution. A method is developed herein to use the Karhunen-Loeve expansion to extract features relevant to classification of a sample taken from one of two pattern classes. Numerical examples are presented to illustrate the technique.