An Optimal Orthogonal Expansion for Classification of Patterns

Authors:
Y. Nakamura;M. Furuya;S. Sunohara
Affiliations:
Faculty of Engineering, Shinshu University;-;-
Venue:
IEEE Transactions on Computers
Year:
1977

Citing 2
Cited 1

Decision-making processes in pattern recognition (ACM monograph series)

Decision-making processes in pattern recognition (ACM monograph series)
Application of the Karhunen-Loève Expansion to Feature Selection and Ordering

IEEE Transactions on Computers

Recent Developments in Pattern Recognition

IEEE Transactions on Computers

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Abstract

In this correspondence, the Karhunen-Loève expansion is generalized for multiclass classification and some optimal properties desirable for the feature extraction process are proved. This expansion is based upon a weighted covariance matrix with the interclass and intraclass distances.