Comments on "Fault Diagnosis of MOS Combinational Networks"

  • Authors:

  • Kuang-Wei Chiang;Z. G. Vranesic

  • Affiliations:

  • Department of Electrical Engineering, University of Ottawa;-

  • Venue:
  • IEEE Transactions on Computers
  • Year:
  • 1984

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Abstract

This correspondence points out that the scope of application of the matrix model for MOS complex gates proposed by El-ziq and Su1does not cover general structures of this type. Also, an example is given to show that a complete detection test set for single stuck-at faults may not be able to detect all multiple faults in a fanout-free and irredundant MOS complex gate.