Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect-Cause Analysis
IEEE Transactions on Computers
| Hi-index | 14.98 |
An abstract model applicable to the use of both diagnostic programs and hardware diagnostic aids in digital systems is presented. The model is capable of dealing with replaceable units having a variety of complexity and is shown in a mathematically rigorous fashion to encompass existing models for diagnosis. A three-level structure for representing faults and a two-level structure for representing tests are employed. Faults, multiple faults, tests, and test results are represented by sets. Relationships between these entities are represented by binary relations and functions.