A maximal resolution guided-probe testing algorithm
DAC '81 Proceedings of the 18th Design Automation Conference
Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis
IEEE Transactions on Computers
An Abstract Model for Digital System Fault Diagnosis
IEEE Transactions on Computers
On Redundancy and Fault Detection in Sequential Circuits
IEEE Transactions on Computers
Fault Equivalence in Combinational Logic Networks
IEEE Transactions on Computers
A Nand Model ror Fault Diagnosis in Combinational Logic Networks
IEEE Transactions on Computers
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs
FTCS '96 Proceedings of the The Twenty-Sixth Annual International Symposium on Fault-Tolerant Computing (FTCS '96)
Embedded fault diagnosis in digital systems with BIST
Microprocessors & Microsystems
| Hi-index | 14.98 |
In this paper we present a new approach to fault diagnosis in sequential circuits based on an effect-cause analysis. This represents an extension of our previous work dealing with combinational circuits [1]. The main tool of our approach is the Deduction Algorithm, which deduces internal values in the circuit under test based upon the test results. The deduced values are used for fault diagnosis, which encompasses both fault detection and location.