A Study of Test Quality/Tester Scan Memory Trade-offs Using the SEMATECH Test Methods Data
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect-Cause Analysis
IEEE Transactions on Computers
ITC'94 Proceedings of the 1994 international conference on Test
A hybrid fault simulator for synchronous sequential circuits
ITC'94 Proceedings of the 1994 international conference on Test
Hi-index | 14.98 |
In this correspondence we show that the well-known concepts of redundancy and undetectability of a stuck-at fault, which are equivalent in combinational circuits, are not equivalent in sequential circuits. We also show that some faults in sequential circuits, which are undetectable (by "conventional" methods of testing), are detectable by transition count testing methods.