On the Design of Minimum Length Fault Tests for Combinational Circuits

Authors:
L. W. Bearnson;C. C. Carroll
Affiliations:
-;-
Venue:
IEEE Transactions on Computers
Year:
1971

Citing 0
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Abstract

Techniques for deriving the minimum length tests are developed for irredundant combinational circuits that contain single faults. The development is based on the Boolean difference function. The Boolean difference function is expanded to form two analytical expressions that can be used to calculate the tests for any stuck-at-zero and stuck-at-one fault within combinational circuits.