Sampling with Hammersley and Halton points
Journal of Graphics Tools
Structured importance sampling of environment maps
ACM SIGGRAPH 2003 Papers
Triple product wavelet integrals for all-frequency relighting
ACM SIGGRAPH 2004 Papers
Fast hierarchical importance sampling with blue noise properties
ACM SIGGRAPH 2004 Papers
Efficient BRDF importance sampling using a factored representation
ACM SIGGRAPH 2004 Papers
Lightcuts: a scalable approach to illumination
ACM SIGGRAPH 2005 Papers
Wavelet importance sampling: efficiently evaluating products of complex functions
ACM SIGGRAPH 2005 Papers
Correlated visibility sampling for direct illumination
The Visual Computer: International Journal of Computer Graphics
Bidirectional importance sampling for direct illumination
EGSR'05 Proceedings of the Sixteenth Eurographics conference on Rendering Techniques
Two stage importance sampling for direct lighting
EGSR'06 Proceedings of the 17th Eurographics conference on Rendering Techniques
Real-time kd-tree based importance sampling of environment maps
Proceedings of the 28th Spring Conference on Computer Graphics
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Most of existing importance sampling methods for direct illumination exploit importance of illumination and surface BRDF. Without taking the visibility into consideration, they can not adaptively adjust the number of samples for each pixel during the sampling process. As a result, these methods tend to produce images with noise in partially occluded regions. In this paper, we introduce an incremental wavelet importance sampling approach, in which the visibility information is used to determine the number of samples at run time. For this purpose, we present a perceptual-based variance that is computed from visibility of samples. In the sampling process, the Halton sample points are incrementally warped for each pixel until the variance of warped samples converges. We demonstrate that our method is more efficient than existing importance sampling approaches.