Defect-tolerance in cellular nanocomputers

Authors:
Teijiro Isokawa;Shin'ya Kowada;Yousuke Takada;Ferdinand Peper;Naotake Kamiura;Nobuyuki Matsui
Affiliations:
Division of Computer Engineering, University of Hyogo, Shosha, Himeji, Hyogo, Japan;Division of Computer Engineering, University of Hyogo, Shosha, Himeji, Hyogo, Japan;Canopus Co., Ltd., Murotani, Nishi-ku, Kobe, Hyogo, Japan;Nano ICT group, National Institute of Information and Communications Technology, Iwaoka, Iwaoka-cho, Nishi-ku, Kobe, Hyogo, Japan;Division of Computer Engineering, University of Hyogo, Shosha, Himeji, Hyogo, Japan;Division of Computer Engineering, University of Hyogo, Shosha, Himeji, Hyogo, Japan
Venue:
New Generation Computing
Year:
2007

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Abstract

For the manufacturing of computers built by nanotechnology, defects are expected to be a major problem. This paper explores this issue for nanocomputers based on cellular automata. Known for their regular structure, such architectures promise cost-effective manufacturing based on molecular self-organization. We show how a cellular automaton can detect defects in a self-contained way, and how it configures circuits on its cells while avoiding the defects. The employed cellular automaton is asynchronous, i.e., it does not require a central clock to synchronize the updates of its cells. This mode of timing is especially suitable for the high integration densities of nanotechnology implementations, since it potentially causes less heat dissipation.