Testing RF Components with Supply Current Signatures

Authors:
S. Sermet Akbay;Shreyas Sen;Abhijit Chatterjee
Affiliations:
Georgia Institute of Technology, Atlanta, GA;Georgia Institute of Technology, Atlanta, GA;Georgia Institute of Technology, Atlanta, GA
Venue:
ATS '07 Proceedings of the 16th Asian Test Symposium
Year:
2007

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Abstract

We propose a technique for low-cost testing of radio-frequency components integrating current signatures and alternate test methodology. The technique is suitable for non-invasive built-in test as well as low-cost automated test equipment (ATE) applications. Main features of the technique are (1) minimum loading on signal path by sampling supply current, (2) flexible test stimulus generation based on system constraints, (3) test time reduction by using a single test stimulus and data acquisition, and (4) accurate prediction of all specification values from the single excitation. Two experiments using the proposed implementation demonstrate the accuracy and efficiency of the technique on both single-balanced and double-balanced mixers built with two different technologies.