A bipartite graph matching approach to generate optimal test sequences for protocol conformance testing

Authors:
Jun Wang;Huaizhong Li;Jitian Xiao;C. Peng Lam
Affiliations:
Wenzhou University, Wenzhou, Zhejiang, China and Edith Cowan University, Perth, WA, Australia;Edith Cowan University, Perth, WA, Australia and Wenzhou University, Wenzhou, Zhejiang, China;Edith Cowan University, Perth, WA, Australia;Edith Cowan University, Perth, WA, Australia
Venue:
ACST'07 Proceedings of the third conference on IASTED International Conference: Advances in Computer Science and Technology
Year:
2007

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Abstract

Conformance testing using test sequences is the main means to ensure that a protocol implementation conforms to its specification. For systems which are specified by nondeterministic finite state machines, a commonly used technique to generate test sequences is the generalized Wp-method with reset which often yields long test sequences if no reliable reset function exists in the system. In this paper, we propose a bipartite graph matching approach to optimize test sequences generated using the generalized Wp-method for protocol conformance testing. Our approach significantly reduces the length of the test sequences required for conformance testing while maintaining the same fault detection capability.