Palmprint verification based on principal lines

Authors:
De-Shuang Huang;Wei Jia;David Zhang
Affiliations:
Intelligent Computation Laboratory, Hefei Institute of Intelligent Machines, Chinese Academy of Science, P.O. Box 1130, Hefei, Anhui 230031, China;Intelligent Computation Laboratory, Hefei Institute of Intelligent Machines, Chinese Academy of Science, P.O. Box 1130, Hefei, Anhui 230031, China and Department of Automation, University of Scien ...;Biometrics Research Centre, Department of Computing, The Hong Kong Polytechnic University, Hong Kong
Venue:
Pattern Recognition
Year:
2008

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Abstract

In this paper, we propose a novel palmprint verification approach based on principal lines. In feature extraction stage, the modified finite Radon transform is proposed, which can extract principal lines effectively and efficiently even in the case that the palmprint images contain many long and strong wrinkles. In matching stage, a matching algorithm based on pixel-to-area comparison is devised to calculate the similarity between two palmprints, which has shown good robustness for slight rotations and translations of palmprints. The experimental results for the verification on Hong Kong Polytechnic University Palmprint Database show that the discriminability of principal lines is also strong.