Principal line based ICP alignment for palmprint verification

  • Authors:
  • Wei Li;Lei Zhang;David Zhang;Jingqi Yan

  • Affiliations:
  • Institute of Image Processing and Pattern Recognition, Shanghai Jiao Tong University, Shanghai, China;Biometrics Research Center, Dept. of Computing, The Hong Kong Polytechnic University, Hong Kong;Biometrics Research Center, Dept. of Computing, The Hong Kong Polytechnic University, Hong Kong;Institute of Image Processing and Pattern Recognition, Shanghai Jiao Tong University, Shanghai, China

  • Venue:
  • ICIP'09 Proceedings of the 16th IEEE international conference on Image processing
  • Year:
  • 2009

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Abstract

Image alignment is a crucial step in palmprint verification. However, most of the existing palmprint alignment methods use only some key points between fingers or in palm boundary to extract the region of interest (ROI), which is consequently used for feature extraction and matching. Such alignment methods can only give a coarse alignment of the palmprint images. This paper presents a new effective refinement method for palmprint alignment by adapting the iterative closest point (ICP) method to the palmprint principal lines. The proposed method offers a more accurate alignment of palmprints by correcting efficiently the shifting, rotation and scaling variations introduced in data acquisition. The experimental results show that the proposed method can greatly improve the palmprint verification accuracy in real time.