Palmprint verification based on robust line orientation code

  • Authors:

  • Wei Jia;De-Shuang Huang;David Zhang

  • Affiliations:

  • Hefei Institute of Intelligent Machines, Chinese Academy of Science, P.O. Box 1130, Hefei 230031, China and Department of Automation, University of Science and Technology of China, Hefei 230027, C ...;Hefei Institute of Intelligent Machines, Chinese Academy of Science, P.O. Box 1130, Hefei 230031, China;Department of Computing, Biometrics Research Centre, The Hong Kong Polytechnic University, Hong Kong

  • Venue:
  • Pattern Recognition
  • Year:
  • 2008

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Abstract

In this paper, we propose a novel robust line orientation code for palmprint verification, whose performance is improved by using three strategies. Firstly, a modified finite Radon transform (MFRAT) is proposed, which can extract the orientation feature of palmprint more accurately and solve the problem of sub-sampling better. Secondly, we construct an enlarged training set to solve the problem of large rotations caused by imperfect preprocessing. Finally, a matching algorithm based on pixel-to-area comparison has been designed, which has better fault tolerant ability. The experimental results of verification on Hong Kong Polytechnic University Palmprint Database show that the proposed approach has higher recognition rate and faster processing speed.