FITTest BENCH06: A New Set of Benchmark Circuits Reflecting Testability Properties

• Authors:

• T. Pecenka;Z. Kotasek;L. Sekanina

• Affiliations:

• -;-;-

• Venue:
• DDECS '06 Proceedings of the 2006 IEEE Design and Diagnostics of Electronic Circuits and systems
• Year:
• 2006