A novel approach for test suite reduction based on requirement relation contraction

Authors:
Zhenyu Chen;Baowen Xu;Xiaofang Zhang;Changhai Nie
Affiliations:
Southeast University, Nanjing, China;Southeast University, Nanjing, China;Southeast University, Nanjing, China;Southeast University, Nanjing, China
Venue:
Proceedings of the 2008 ACM symposium on Applied computing
Year:
2008

Citing 9
Cited 5

Constraint-Based Automatic Test Data Generation

IEEE Transactions on Software Engineering
A methodology for controlling the size of a test suite

ACM Transactions on Software Engineering and Methodology (TOSEM)
Efficient coverage testing using global dominator graphs

Proceedings of the 1999 ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
Automatically Generating Test Data from a Boolean Specification

IEEE Transactions on Software Engineering
Using Spanning Sets for Coverage Testing

IEEE Transactions on Software Engineering
Bi-Criteria Models for All-Uses Test Suite Reduction

Proceedings of the 26th International Conference on Software Engineering
A concept analysis inspired greedy algorithm for test suite minimization

PASTE '05 Proceedings of the 6th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering
An experimental comparison of four test suite reduction techniques

Proceedings of the 28th international conference on Software engineering
Comparing Fault-based Testing Strategies of General Boolean Specifications

COMPSAC '07 Proceedings of the 31st Annual International Computer Software and Applications Conference - Volume 01

A Bi-objective Model Inspired Greedy Algorithm for Test Suite Minimization

FGIT '09 Proceedings of the 1st International Conference on Future Generation Information Technology
A study of relative redundancy in test-suite reduction while retaining or improving fault-localization effectiveness

Proceedings of the 2010 ACM Symposium on Applied Computing
A test suite reduction approach based on pairwise interaction of requirements

Proceedings of the 2011 ACM Symposium on Applied Computing
Bi-criteria test suite reduction by cluster analysis of execution profiles

CEE-SET'09 Proceedings of the 4th IFIP TC 2 Central and East European conference on Advances in Software Engineering Techniques
A test-suite reduction approach to improving fault-localization effectiveness

Computer Languages, Systems and Structures

Quantified Score

Hi-index	0.00

Visualization

Abstract

The goal of test suite reduction is to satisfy all testing requirements with the minimum number of test cases. Existing techniques can be applied well on the constructed test suite. However, it is possible and necessary to optimize testing requirements before test case generation. In this paper test suite reduction is solved by testing requirement optimization. A requirement relation graph is proposed to minimize the requirement set by graph contraction. An experiment on specification-based testing is designed and implemented. The empirical studies show that the testing requirements can be optimized by the graph contraction methods effectively.