A test suite reduction approach based on pairwise interaction of requirements

  • Authors:

  • Xiang Chen;Lijiu Zhang;Qing Gu;Haigang Zhao;Ziyuan Wang;Xiaobing Sun;Daoxu Chen

  • Affiliations:

  • Nanjing University, Nanjing, China;Nanjing University, Nanjing, China;Nanjing University, Nanjing, China;Nanjing University, Nanjing, China;Nanjing University, Nanjing, China;Southeast University, Nanjing, China;Nanjing University, Nanjing, China

  • Venue:
  • Proceedings of the 2011 ACM Symposium on Applied Computing
  • Year:
  • 2011

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Abstract

Test suite reduction is one of the effective techniques to reduce the cost of regression testing. In particular, it tries to identify and remove redundant test cases according to a specific test coverage criterion. However, the excessive reduction in test cases may also significantly weaken the fault detection ability of the original test suite. In this paper, we conjecture that covering interaction of test requirements can improve the fault detection ability and propose a new test suite reduction approach. As a preliminary study, we firstly propose a pairwise interaction based coverage criterion (PWIC). Then we propose a pairwise interaction of requirements based test suite reduction approach (PWIR). To assess the feasibility and usefulness of our proposed approach, we implement PWIR approach and conduct an empirical study on seven real C programs. After analyzing the results of the empirical studies, we conclude that our approach can improve the fault detection ability without severely increasing the reduced test suite size.