Automatic test data generation using particle systems

Authors:
Paulo M. S. Bueno;W. Eric Wong;Mario Jino
Affiliations:
Renato Archer Research Center, Campinas, São Paulo, Brazil;University of Texas at Dallas, Richardson, TX;State University of Campinas, Campinas, São Paulo, Brazil
Venue:
Proceedings of the 2008 ACM symposium on Applied computing
Year:
2008

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Abstract

The simulated repulsion algorithm, which is based on particle systems, is used for the automatic generation of diversity oriented test sets (DOTS). These test sets are generated by taking randomly generated test sets and iteratively improving their diversity (the level of variability among values for the test data) towards DOTS. The results of a simulation performed to evaluate characteristics of DOTS indicate improvement, with respect to fault detection, of these test sets over the standard random test sets.