A hierarchical approach for fast and robust ellipse extraction

  • Authors:

  • F. Mai;Y. S. Hung;H. Zhong;W. F. Sze

  • Affiliations:

  • Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong;Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong;Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong;Department of Electrical and Electronic Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong

  • Venue:
  • Pattern Recognition
  • Year:
  • 2008

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Abstract

This paper presents a hierarchical approach for fast and robust ellipse extraction from images. At the lowest level, the image is described as a set of edge pixels, from which line segments are extracted. Then, line segments that are potential candidates of elliptic arcs are linked to form arc segments according to connectivity and curvature conditions. Next, arc segments that belong to the same ellipse are grouped together. Finally, a robust statistical method, namely RANSAC, is applied to fit ellipses to groups of arc segments. Unlike Hough Transform based algorithms, this method does not need a high dimensional parameter space, and so it reduces the computation and storage requirements. Experiments on both synthetic and real images demonstrate that the proposed method has excellent performance in handling occlusion and overlapping ellipses.