A parameterless line segment and elliptical arc detector with enhanced ellipse fitting

Authors:
Viorica Pătrăucean;Pierre Gurdjos;Rafael Grompone von Gioi
Affiliations:
IRIT-ENSEEIHT, Toulouse, France,Military Technical Academy of Bucharest, Romania;IRIT-ENSEEIHT, Toulouse, France;CMLA, ENS Cachan, France
Venue:
ECCV'12 Proceedings of the 12th European conference on Computer Vision - Volume Part II
Year:
2012

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Abstract

We propose a combined line segment and elliptical arc detector, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse fitting technique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated images and on natural images.