IEEE Transactions on Pattern Analysis and Machine Intelligence
Measuring shape: ellipticity, rectangularity, and triangularity
Machine Vision and Applications
Evaluating Harker and O'Leary's distance approximation for ellipse fitting
Pattern Recognition Letters
Conic fitting using the geometric distance
ACCV'07 Proceedings of the 8th Asian conference on Computer vision - Volume Part II
Direct ellipse fitting and measuring based on shape boundaries
PSIVT'07 Proceedings of the 2nd Pacific Rim conference on Advances in image and video technology
Journal on Computing and Cultural Heritage (JOCCH)
A parameterless line segment and elliptical arc detector with enhanced ellipse fitting
ECCV'12 Proceedings of the 12th European conference on Computer Vision - Volume Part II
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