Precise ellipse estimation without contour point extraction

  • Authors:
  • Jean-Nicolas Ouellet;Patrick Hébert

  • Affiliations:
  • Laval University, Department of Electrical & Computer Engineering, 1065 Avenue de la méédecine, Quebec, Canada;Laval University, Department of Electrical & Computer Engineering, 1065 Avenue de la méédecine, Quebec, Canada

  • Venue:
  • Machine Vision and Applications
  • Year:
  • 2009

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Abstract

This paper presents a simple linear operator that accurately estimates the parameters of ellipse features. Based on the dual conic model, the operator directly exploits the raw gradient information in the neighborhood of an ellipse’s boundary, thus avoiding the intermediate stage of precisely extracting individual edge points. Moreover, under the dual representation, the dual conic can easily be constrained to a dual ellipse when minimizing the algebraic distance. The new operator is compared to other estimation approaches, including those limited to the center position, in simulation as well as in real situation experiments.