Dynamic virtual ground voltage estimation for power gating

Authors:
Hao Xu;Ranga Vemuri;Wen-Ben Jone
Affiliations:
University of Cincinnati, Cincinnati, OH, USA;University of Cincinnati, Cincinnati, OH, USA;University of Cincinnati, Cincinnati, OH, USA
Venue:
Proceedings of the 13th international symposium on Low power electronics and design
Year:
2008

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Abstract

With the technology moving into the deep sub-100nm region, the increase of leakage power consumption necessitates more aggressive power reduction techniques. Power gating is a promising technique. Our research emphasizes the virtual ground voltage (VVG) as the key to make critical design trade-offs for power gating. We develop an accurate model to estimate the dynamic VVG value of a circuit block as a function of time after its ground is gated. Experimental results show that the model has less than 1% average error compared with HSPICE results. The CAD tool implemented based on the model has a 100 times speedup over HSPICE.