Post-fabrication measurement-driven oxide breakdown reliability prediction and management
Proceedings of the 2009 International Conference on Computer-Aided Design
Adaptive online testing for efficient hard fault detection
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
SRAM-based NBTI/PBTI sensor system design
Proceedings of the 47th Design Automation Conference
Compact degradation sensors for monitoring NBTI and oxide degradation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Continued technology scaling exacerbates the incidence of degradation and failure in integrated circuits due to mechanisms such as oxide breakdown, negative bias temperature instability and electromigration. This work analyzes the impact of different factors on lifetime distributions for the oxide breakdown effect using a novel monte carlo approach based upon the percolation model and BSIM4. Results of the analysis of oxide failure distributions are used to explore real-time lifetime projection and the use of in-situ monitoring circuits. Under an ideal sensor assumption, the work shows that 500-1000 sensors would be needed to provide lifetime projections with error under 8-10%.