Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles
Journal of Electronic Testing: Theory and Applications
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A wireless, embedded signal delivery system for RF or microwave embedded test of ICs is demonstrated. Compared to conventional RF test methods, the proposed test scheme has the potential benefits of testing multiple circuits simultaneously with a single RF test source and simplified test signal delivery. A preliminary application of this wireless embedded test is presented through an example low-noise amplifier measurement; wireless 5-GHz LNA measurement results agree with network analyzer measurements.