Oscillator design & computer simulation
Oscillator design & computer simulation
RF microelectronics
Mixed-Signal BIST: Fact or Fiction
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A Signature Test Framework for Rapid Production Testing of RF Circuits
Proceedings of the conference on Design, automation and test in Europe
Prediction of Analog Performance Parameters Using Oscillation Based Test
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Robust Built-In Test of RF ICs Using Envelope Detectors
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
Low Cost RF Receiver Parameter Measurement with On-Chip Amplitude Detectors
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
Wireless System for Microwave Test Signal Generation
IEEE Design & Test
DSP-driven self-tuning of RF circuits for process-induced performance variability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A novel self-healing methodology for RF amplifier circuits based on oscillation principles
Proceedings of the Conference on Design, Automation and Test in Europe
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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In this paper, we propose a low-cost approach for testing GHz RF amplifiers. It is demonstrated for the first time that GHz RF amplifiers can be tested for their specifications using oscillation principles. In the test mode, the RF test signal is "self generated" by the amplifier with the help of additional external circuitry which forces the amplifier to oscillate (Barkhausen criterion) around its characteristic frequency. The RF sinusoidal output from the oscillating RF amplifier is down-converted to a lower frequency enabling low frequency test response analysis as well as increased sensitivity to parametric deviations. In addition to the detection of catastrophic failures, it is shown that multiple RF specifications (Gain, P1dB, and Noise Figure) can be predicted via analysis of the frequency of the down-converted response. To account for RF parasitics on the production floor, a calibration technique is proposed in the test-setup. Thus, the proposed method reduces test cost significantly by reducing the cost of test setup (by as much as 80%) and significantly reducing test time. The viability of the proposed test method is demonstrated both by simulation experiments and measurement.