A new self-healing methodology for RF amplifier circuits based on oscillation principles

Authors:
Abhilash Goyal;Madhavan Swaminathan;Abhijit Chatterjee;Duane C. Howard;John D. Cressler
Affiliations:
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA;School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA
Venue:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year:
2012

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Abstract

This paper proposes a new self-healing methodology for embedded RF amplifiers in RF sub-systems. The proposed methodology is based on oscillation principles in which the device-under-test (DUT) generates its test signature with the help of additional circuitry. In the proposed methodology, the self-generated test signature from the RF amplifier is analyzed by using on-chip resources for testing and controlling its calibration knobs to compensate for multi-parameter variations in the manufacturing process. Thus, the proposed methodology enables self-test and self-calibration/correction of RF amplifiers without the need for an external test stimulus, enabling true self-healing RF designs. The proposed methodology is demonstrated through simulations as well as measurements performed on an RF LNA, which were designed in a commercially-available SiGe BiCMOS process technology.