Proceedings of the IEEE International Test Conference
7.2 Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Generation for Accurate Prediction of Analog Specifications
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Testing analog and mixed-signal integrated circuits using oscillation-test method
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Prediction of analog performance parameters using fast transient testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A comprehensive signature analysis scheme for oscillation-test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Predictive test strategy for CMOS RF mixers
Integration, the VLSI Journal
Verifying functional specifications by regression techniques on Lissajous test signatures
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles
Journal of Electronic Testing: Theory and Applications
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
Journal of Electronic Testing: Theory and Applications
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Oscillation Based Test (OBT) is a low-cost and vectorlesstest technique for analog and mixed-signal integratedcircuits. Previous research with OBT has focussed primarilyon structural issues with an emphasis on fault detectionrather than determining the conformance of the Circuit UnderTest (CUT) with its specifications, or evaluation of CUTperformance. This paper presents a novel methodology forefficient interpretation of OBT results. The proposed PredictiveOscillation Based Test (POBT) methodology uses adaptiveregression models to predict the performance parametersof the CUT from the oscillation measurements. Simulationresults indicate that, under parametric variations, thismethodology can determine CUT performance parameters,resulting in enhanced test effectiveness.