Alternative test methods using IEEE 1149.4
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Fault Models and Test Generation for OpAmp Circuits—The FFM
Journal of Electronic Testing: Theory and Applications
A Simple and Secure Start-Up Circuitry for Oscillation-Based-Test Application
Analog Integrated Circuits and Signal Processing
Practical Oscillation-Based Test of Integrated Filters
IEEE Design & Test
Effective Oscillation-Based Test for application to a DTMF Filter Bank
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Prediction of Analog Performance Parameters Using Oscillation Based Test
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
LFSR-based BIST for analog circuits using slope detection
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks
Journal of Electronic Testing: Theory and Applications
Journal of Electronic Testing: Theory and Applications
A simple built-in current sensor for IDDQ testing of CMOS data converters
Integration, the VLSI Journal
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
Journal of Electronic Testing: Theory and Applications
A design-for-digital-testability circuit structure for Σ-Δ modulators
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits
IEICE - Transactions on Information and Systems
Evaluation of analog/RF test measurements at the design stage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A simple built-in current sensor for IDDQ testing of CMOS data converters
Integration, the VLSI Journal
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications
A Reconfiguration Method to Improve the Yield of Bandwidth-Limited Pipelined ADCs
International Journal of Measurement Technologies and Instrumentation Engineering
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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A new low-cost test method for analog integrated circuits, called the oscillation test, is presented. During the test mode, the circuit under test (CUT) is converted to a circuit that oscillates. Faults in the CUT which deviate the oscillation frequency from its tolerance band can be detected. Using this test method, no test vector is required to be applied. Therefore, the test vector generation problem is eliminated, and the test time is very small because only a single output frequency is evaluated for each CUT. The oscillation frequency may be considered as a digital signal and therefore can be evaluated using pure digital circuitry. These characteristics imply that the oscillation-test strategy is very attractive for wafer-probe testing as well as final production testing. In this note, the validity of the proposed test method has been verified throughout various examples such as operational amplifiers, amplifiers, filters, and analog-to-digital converters (ADCs). The simulations and practical implementation results affirm that the presented method assures a high fault coverage