Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks

Authors:
Tiago R. Balen;Antonio Q. Andrade, Jr.;Florence Azaïs;Marcelo Lubaszewski;Michel Renovell
Affiliations:
Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;LIRMM, Université de Montpellier II: Sciences et Techniques du Languedoc, Montpellier Cedex 5, France;Departamento de Engenharia Elétrica, Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil;LIRMM, Université de Montpellier II: Sciences et Techniques du Languedoc, Montpellier Cedex 5, France
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2005

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Abstract

This paper presents the application of the oscillation test methodology as an alternative to test configurable analog blocks of Field Programmable Analog Arrays. The blocks of the device under test are first configured to behave as oscillators. Then, the output frequency and amplitude are observed to obtain the signature of the fault-free circuit. During test, this signature is compared to the actual output signal. Experimental results show the effectiveness of the method in detecting parametric and large deviation faults of the tested components.