Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Characterization of Floating Gate Defects in Analog Cells
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
Digital detection of analog parametric faults in SC filters
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Oscillation Ring Delay Test for High Performance Microprocessors
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Analog Integrated Circuits and Signal Processing
Microsystems testing: an approach and open problems
Proceedings of the conference on Design, automation and test in Europe
On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits
Analog Integrated Circuits and Signal Processing
Hierarchical ATPG for Analog Circuits and Systems
IEEE Design & Test
Practical Oscillation-Based Test of Integrated Filters
IEEE Design & Test
An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs
IEEE Design & Test
Efficient and accurate testing of analog-to-digital converters using oscillation-test method
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Design of Oscillation-Based Test Structures for Active RC Filters
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Test Metrics for Analog Parametric Faults
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
EXPERIMENTAL RESULTS FOR CURRENT-BASED ANALOG SCAN
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Optical Communication Channel Test Using BIST Approaches
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Effective Oscillation-Based Test for application to a DTMF Filter Bank
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A Design for Testability Scheme for CMOS LC-Tank Voltage Controlled Oscillators
Journal of Electronic Testing: Theory and Applications
A 0.8 μm CMOS switched-capacitor video filter
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks
Journal of Electronic Testing: Theory and Applications
Proceedings of the 42nd annual Design Automation Conference
Efficient Parametric Fault Detection in Switched-Capacitor Filters
IEEE Design & Test
IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Exploring the Ability of Oscillation Based Test for Testing Continuous -Time Ladder Filters
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
A 0.8 µm CMOS testable switched-capacitor filter for video frequency applications
Analog Integrated Circuits and Signal Processing
Total ionizing dose effects in switched-capacitor filters using oscillation-based test
Proceedings of the 20th annual conference on Integrated circuits and systems design
Journal of Electronic Testing: Theory and Applications
Oscillation Test Scheme of SC Biquad Filters Based on Internal Reconfiguration
Journal of Electronic Testing: Theory and Applications
Testing digital low-pass filters using oscillation-based test
Microprocessors & Microsystems
Complex oscillation-based test and its application to analog filters
IEEE Transactions on Circuits and Systems Part I: Regular Papers - Special issue on ISCAS 2009
Analog circuit test based on a digital signature
Proceedings of the Conference on Design, Automation and Test in Europe
Journal of Electronic Testing: Theory and Applications
Oscillation-based analog diagnosis using artificial neural networks based inference mechanism
Computers and Electrical Engineering
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A new low-cost test method for analog integrated circuits, called oscillation-test, is presented. During the test mode, the circuit under test (CUT) is converted to a circuit that oscillates. Faults in the CUT which cause a reasonable deviation of the oscillation frequency from its nominal value can be detected. Using this test method, no test vector is required to be applied. Therefore, the test vector generation problem is eliminated and the test time is very small because a limited number of oscillation frequencies is evaluated for each CUT. Due to its digital nature, the oscillation frequency can be easily interfaced to boundary scan. This characteristics imply that oscillation-test strategy is very attractive for wafer-probe testing as well as final production testing. In this paper, the validity of the proposed test method has been verified throughout some examples such as operational amplifiers and analog-to-digital converter (ADC).