Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Thermal Monitoring of Self-Checking Systems
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components
EDTC '96 Proceedings of the 1996 European conference on Design and Test
A conceptual design environment for micromechanisms
EDTC '96 Proceedings of the 1996 European conference on Design and Test
High level CAD melds microsystems with foundries
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Oscillation-test strategy for analog and mixed-signal integrated circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A method to diagnose faults in linear analog circuits using an adaptive tester
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A fault simulation methodology for MEMS
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Extending Fault-Based Testing to Microelectromechanical Systems
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
Journal of Electronic Testing: Theory and Applications
On the Integration of Design and Test for Chips Embedding MEMS
IEEE Design & Test
MEMS fault model generation using CARAMEL
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Fault modeling of suspended thermal MEMS
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Particulate Failures for Surface-Micromachined MEMS
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Electro-thermal Stimuli for MEMS Testing in FSBM Technology
Journal of Electronic Testing: Theory and Applications
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In this work a Computer-Aided Testing (CAT) tool is proposed that brings a systematic way of dealing with testing problems in emerging microsystems. Experiments with case-studies illustrate the techniques and tools embedded in the CAT environment. Some of the many open problems that shall be addressed in the near future as an extension to this work are also discussed.