FSPICE: a tool for fault modelling in MOS circuits
Integration, the VLSI Journal
DRAFTS: discretized analog circuit fault simulator
DAC '93 Proceedings of the 30th international Design Automation Conference
Analogue Fault Simulation Based on Layout-Dependent Fault Models
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Fault Modeling for the Testing of Mixed Integrated Circuits
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Defect-oriented test methodology for complex mixed-signal circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A design-for-test structure for optimising analogue and mixed signal IC test
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Mixed-signal circuits and boards for high safety applications
EDTC '95 Proceedings of the 1995 European conference on Design and Test
EDTC '95 Proceedings of the 1995 European conference on Design and Test
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A solution for the on-line test of analog ladder filters
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Frequency-based BIST for analog circuit testing
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Extending Fault-Based Testing to Microelectromechanical Systems
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Microsystems testing: an approach and open problems
Proceedings of the conference on Design, automation and test in Europe
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
Journal of Electronic Testing: Theory and Applications
On the Integration of Design and Test for Chips Embedding MEMS
IEEE Design & Test
MEMS fault model generation using CARAMEL
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Fault modeling of suspended thermal MEMS
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Particulate Failures for Surface-Micromachined MEMS
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Electro-thermal Stimuli for MEMS Testing in FSBM Technology
Journal of Electronic Testing: Theory and Applications
Built-in-self-test techniques for MEMS
Microelectronics Journal
Hi-index | 0.00 |
Based on fault simulation experiments with two microsystems, a resonant silicon beam force sensor and a miniature opto-electric transformer, this paper demonstrates the necessity to consider the interrelations between nominal system models, fault models, the construction of simulation models being capable of injecting faults, and the representation of faults in a fault list of a fault simulator from the very beginning. Some suggestions will be discussed how to tackle these problems occurring in fault modelling and fault simulation of microsystems.