CONCERT: a concurrent transient fault simulator for nonlinear analog circuits
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Fault Modeling and Simulation Using VHDL-AMS
Analog Integrated Circuits and Signal Processing - Special issue: Analog VHDL
Journal of Electronic Testing: Theory and Applications
Closing the gap between analog and digital
Proceedings of the 37th Annual Design Automation Conference
Analog Integrated Circuits and Signal Processing - Special issue on selected papers from ECS '97
An approach to realistic fault prediction and layout design for testability in analog circuits
Proceedings of the conference on Design, automation and test in Europe
Analog Testing with Time Response Parameters
IEEE Design & Test
Defect-oriented test methodology for complex mixed-signal circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A design-for-test structure for optimising analogue and mixed signal IC test
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Analogue Fault Modelling and Simulation for Supply Current Monitoring
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Compact structural test generation for analog macros
EDTC '97 Proceedings of the 1997 European conference on Design and Test
A new quality estimation methodology for mixed-signal and analogue ICs
EDTC '97 Proceedings of the 1997 European conference on Design and Test
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Bridges in sequential CMOS circuits: current-voltage signature
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Analog Transient Concurrent Fault Simulation with Dynamic Fault Grouping
ICCD '00 Proceedings of the 2000 IEEE International Conference on Computer Design: VLSI in Computers & Processors
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation
Journal of Electronic Testing: Theory and Applications
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